15. Yield Models - Binomial
Probability that k out of n total defects are on a particular die:
n = D0Aw, Aw = wafer area, p = A/Aw
Yield = P(0) = (1 - A/Aw)D0Aw
If Aw >> A, then Yield ≈ e-D0A
n = D0Aw, Aw = wafer area, p = A/Aw
Yield = P(0) = (1 - A/Aw)D0Aw
If Aw >> A, then Yield ≈ e-D0A